yaworsw/euler-manager

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data/problems/307.yml

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---
:id: 307
:name: Chip Defects
:url: https://projecteuler.net/problem=307
:content: "<var>k</var> defects are randomly distributed amongst <var>n</var> integrated-circuit
  chips produced by a factory (any number of defects may be found on a chip and each
  defect is independent of the other defects).\n\nLet p(<var>k,n</var>) represent
  the probability that there is a chip with at least 3 defects.  \nFor instance p(3,7)
  ≈ 0.0204081633.\n\nFind p(20 000, 1 000 000) and give your answer rounded to 10
  decimal places in the form 0.abcdefghij\n\n"